Good News!
Publication's Findings could Impact Thermal Management and Reliability of Nanoscale Devices University of Colorado Research Associate, Mark Siemens, is the lead author on a soon-to-be published paper in Nature Materials. The paper, entitled 'Quasi-ballistic thermal transport from nanoscale interfaces observed using ultrafast coherent soft X-ray beams', demonstrates findings that could have significant impact on the thermal management and reliability of emerging nanoscale devices. iMINT faculty researcher Ronggui Yang along with CU's Qing Li, Margaret Murnane and Henry Kapteyn, Keith Nelson of MIT, and Erik Anderson of the Lawrence Berkeley Labs and Center for X-Ray Optics also contributed to the article.
- Over 100 MEMS (microelectromechanical systems) transducers will be used in each future automobile.
- Over 10 MEMS sensors and actuators will be used in each cell phone.
- Military and commercial applications will increasingly benefit from the use of MEMS, especially when anticipated significant improvements in performance are realized via the integration of MEMS with novel nanoelectromechanical systems (NEMS).
- iMINT Overview.
- Atomic layer deposition/Molecular layer deposition.
- Defect-free GaN nanowires grown on silicon.
- Single-layer graphene, the strongest material ever measured.
- 3D configured or all-solid-state batteries.
- Micro cryocooler.
